Use of Atomic Force Microscopy and Nanoindentation for Characterization of Cemetitious Materials at the Nanoscale

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Title: Use of Atomic Force Microscopy and Nanoindentation for Characterization of Cemetitious Materials at the Nanoscale

Author(s): P. Mondal, S.P. Shah, and L.D. Marks

Publication: Special Publication

Volume: 254

Issue:

Appears on pages(s): 41-56

Keywords: atomic force microscope; cement paste nanostructure; mechanical properties; nanoindentation

Date: 10/1/2008

Abstract:
In this research, sample preparation techniques were developed to image the nano- and microstructure of hardened cement paste and to determine local mechanical properties. An atomic force microscope (AFM) was used to image the nanostructure of hardened cement paste. AFM and a Hysitron Triboindenter equipped with an in-situ scanning probe microscopy were used to determine the Young’s modulus of cement paste at the nanoscale.